Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. - Tohru Koyama; Masataka Umeno; Kenichiro Sonoda; Junko Komori; Yoji Mashiko (Microelectron. Reliab., 2001)

Study of non-contact nano-probing technique using FIB. - Yoji Mashiko; Hiroaki Etoh; Akiyoshi Furukawa; Daisuke Nomiyama; Osamu Ichimaru (Microelectron. Reliab., 2010)

Study on non-contact current path formation using charged particle beams. - J. Ma; Y. Fujimura; M. Utsumi; S. Tomonaga; Yoji Mashiko (Microelectron. Reliab., 2016)