An experimental 16-Mbit DRAM with reduced peak-current noise. - Daeje Chin; Changhyun Kim; Yunho Choi; Dong-Sun Min; Hong-Sun Hwang; Hoon Choi; Soo-In Cho; Tae-Young Chung; Chan J. Park; Yunseung Shin; Kwang Pyuk Suh; Yong E. Park (IEEE J. Solid State Circuits, 1989)