A study of advanced layout verification to prevent leakage current failure during power down mode operation. - Yong-Ha Song; Myoung-Lae Park; Gye-Won Jung; Taek-Soo Kim (Microelectron. Reliab., 2002)

A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology. - Yong-Ha Song; S. G. Kim; S. B. Lee; K. J. Rhee; T. S. Kim (Microelectron. Reliab., 2003)

A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. - Yong-Ha Song; Choong-Kyun Kim; Moo-Young Park; Bum-Suk Kye; Jeongil Seo; Dong-Soo Cho; Taek-Soo Kim; Gab-soo Han (Microelectron. Reliab., 2004)

Lithium niobate MEMS devices and subsystems for radio frequency signal processing. - Songbin Gong; Yong-Ha Song; Tomas Manzaneque; Ruochen Lu; Yansong Yang; Ali Kourani (MWSCAS, 2017)