Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids. - Valeriy Sukharev; Armen Kteyan; Farid N. Najm; Yong Hyeon Yi; Chris H. Kim; Jun-Ho Choy; Sofya Torosyan; Yu Zhu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. - Yong Hyeon Yi; Chris H. Kim; Chen Zhou; Armen Kteyan; Valeriy Sukharev (IRPS, 2023)

Electromigration Assessment in Power Grids with Account of Redundancy and Non-Uniform Temperature Distribution. - Armen Kteyan; Valeriy Sukharev; Alexander Volkov; Jun-Ho Choy; Farid N. Najm; Yong Hyeon Yi; Chris H. Kim; Stéphane Moreau (ISPD, 2023)

Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis. - Yong Hyeon Yi; Chris H. Kim; Armen Kteyan; Alexander Volkov; Stéphane Moreau; Valeriy Sukharev (IRPS, 2024)