New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology. - Yong Liu 035; Pengpeng Ren; Da Wang; Longda Zhou; Zhigang Ji; Junhua Liu 001; Runsheng Wang; Ru Huang 001 (IRPS, 2022)

Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. - Da Wang; Yong Liu 035; Pengpeng Ren; Longda Zhou; Zhigang Ji; Junhua Liu 001; Runsheng Wang; Ru Huang 001 (IRPS, 2022)

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. - Da Wang; Yongkang Xue; Yong Liu 035; Pengpeng Ren; Zixuan Sun; Zirui Wang; Yueyang Liu; Zhijun Cheng; Haiyang Yang; Xiangli Liu; Blacksmith Wu; Kanyu Cao; et al. (IRPS, 2024)