Degradation of pMOSFETs due to hot electron induced punchthrough. - Donghee Son; Gang-Jun Kim; Ji-Hoon Seo; Nam-Hyun Lee; YongHa Kang; Bongkoo Kang (Microelectron. Reliab., 2016)

Channel width dependence of AC stress on bulk nMOSFETs. - Donghee Son; Gang-Jun Kim; Ji-Hoon Seo; Nam-Hyun Lee; YongHa Kang; Bongkoo Kang (Microelectron. Reliab., 2016)