A novel pixel design with hybrid type isolation scheme for low dark current in CMOS image sensor. - Sung Ho Choi; Yi Tae Kim; Min Seok Oh; Younghwan Park; Jeongjin Cho; Youngheup Jang; Hyungjun Han; Jongwon Choi; Howoo Park; Sangil Jung; Hoon Sang Oh; Jung Chak Ahn; et al. (Sensors, Cameras, and Systems for Industrial and Scientific Applications, 2013)

Off-state degradation with ac bias in PMOSFET. - Segeun Park; Hyuckchai Jung; Jeonghoon Oh; Ilgweon Kim; Hyoungsun Hong; Gyoyoung Jin; Yonghan Roh (Microelectron. Reliab., 2016)

Regression Yield Analysis for Semiconductor Manufacturing Based on Fabrication Conditions. - Youjin Lee; Yonghan Roh (IEEE Big Data, 2022)