A new Inter-electrode coupling capacitance extraction method for deep-submicron AlGaN/GaN HEMTs. - Xiaodong Zhao; Yuehang Xu; Zhang Wen; Yonghao Jia; Tiedi Zhang; Bo Yan; Ruimin Xu (IEICE Electron. Express, 2017)

A Threshold Voltage Model for Charge Trapping Effect of AlGaN/GaN HEMTs. - Yonghao Jia; Zhang Wen; Yongbo Chen; Cheng-Cheng Xie; Yong-Xin Guo; Yuehang Xu (IEEE Access, 2019)