A New Maximal Diagnosis Algorithm for Bus-structured Systems. - YongJoon Kim; DongSub Song; YongSeung Shin; Sunghoon Chun; Sungho Kang 001 (ITC, 2003)

Test-decompression mechanism using a variable-length multiple-polynomial LFSR. - Hong-Sik Kim; YongJoon Kim; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2003)

A new maximal diagnosis algorithm for interconnect test. - YongJoon Kim; Hyun-Don Kim; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2004)

An Effective Test Pattern Generation for Testing Signal Integrity. - YongJoon Kim; Myung-Hoon Yang; Youngkyu Park; Daeyeal Lee; Sungho Kang 001 (ATS, 2006)

MICRO: a new hybrid test data compression/decompression scheme. - Sunghoon Chun; YongJoon Kim; Jung-Been Im; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2006)

High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. - Sunghoon Chun; YongJoon Kim; Sungho Kang 001 (ATS, 2007)

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. - Sunghoon Chun; YongJoon Kim; Sungho Kang 001 (J. Electron. Test., 2007)

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. - Sunghoon Chun; YongJoon Kim; Taejin Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. - Taejin Kim; Sunghoon Chun; YongJoon Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. - Sunghoon Chun; Taejin Kim; YongJoon Kim; Sungho Kang 001 (VTS, 2008)

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. - Myung-Hoon Yang; YongJoon Kim; Sunghoon Chun; Sungho Kang 001 (J. Electron. Test., 2008)

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. - Sunghoon Chun; YongJoon Kim; Taejin Kim; Sungho Kang 001 (VTS, 2009)

Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. - YongJoon Kim; Jaeseok Park; Sungho Kang 001 (IEICE Electron. Express, 2009)

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. - YongJoon Kim; Myung-Hoon Yang; Jaeseok Park; Eunsei Park; Sungho Kang 001 (IEICE Trans. Inf. Syst., 2009)

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption. - YongJoon Kim; Jaeseok Park; Sungho Kang 001 (IEICE Trans. Inf. Syst., 2010)

Selective Scan Slice Grouping Technique for Efficient Test Data Compression. - YongJoon Kim; Jaeseok Park; Sungho Kang 001 (IEICE Trans. Inf. Syst., 2010)

Temperature and voltage droop-aware test scheduling during scan shift operation. - Taehee Lee 003; YongJoon Kim; Joon-Sung Yang (IEICE Electron. Express, 2016)