Influence of I/O oxide process on the NBTI performance of 28 nm HfO2-based HKMG p-MOSFETs. - Wei-Ting Kary Chien; Yueqin Zhu; Yongliang Song; Atman Yong Zhao (Microelectron. Reliab., 2016)

Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests. - Wei-Ting Kary Chien; Atman Yong Zhao; Yueqin Zhu; Yongliang Song (Microelectron. Reliab., 2016)