GAN-based Defect Image Generation for Imbalanced Defect Classification of OLED panels. - Yongmoon Jeon; Haneol Kim; Hyeona Lee; Seonghoon Jo; Jaewon Kim (EGSR (ST), 2022)

Gradient-Free Classifier Guidance for Diffusion Model Sampling. - Rahul Shenoy; Zhihong Pan 001; Kaushik Balakrishnan; Qisen Cheng; Yongmoon Jeon; Heejune Yang; Jaewon Kim (CoRR, 2024)