A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. - Yongqi Fu; Zhongwei Shen; Ngoi Kok Ann Bryan (Microelectron. J., 2004)

MMCircuitEval: A Comprehensive Multimodal Circuit-Focused Benchmark for Evaluating LLMs. - Chenchen Zhao; Zhengyuan Shi; Xiangyu Wen; Chengjie Liu; Yi Liu; Yunhao Zhou; Yuxiang Zhao; Hefei Feng; Yinan Zhu; Gwok-Waa Wan; Xin Cheng; Weiyu Chen; et al. (CoRR, 2025)