Electrical properties of vacuum annealed La2O3 thin films grown by E-beam evaporation. - Yongshik Kim; Kunihiro Miyauchi; Shun'ichiro Ohmi; Kazuo Tsutsui; Hiroshi Iwai (Microelectron. J., 2005)

SRAM stability design comprehending 14nm FinFET reliability. - Choelhwyi Bae; Sangwoo Pae; Cheong-sik Yu; Kangjung Kim; Yongshik Kim; Jongwoo Park 001 (IRPS, 2015)