ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. - Yoon Huh; Peter Bendix; Kyungjin Min; Jau-Wen Chen; Ravindra Narayan; Larry D. Johnson; Steven H. Voldman (IWSOC, 2005)

Universal Joint Source-Channel Coding for Modulation-Agnostic Semantic Communication. - Yoon Huh; Hyowoon Seo; Wan Choi 001 (IEEE J. Sel. Areas Commun., 2025)