A study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits. - Yoonjong Huh; Yungkwon Sung; Sung-Mo Kang (IEEE J. Solid State Circuits, 1998)

Understanding and Addressing the Noise Induced By Electrostatic Discharge in Multiple Power Supply Systems. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (ICCD, 2001)

Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (ISCAS (4), 2001)

ESD design rule checker. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

Full chip ESD design rule checking. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

Chip-level charged-device modeling and simulation in CMOS integrated circuits. - Jaesik Lee; Ki-Wook Kim; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

Design of ESD power protection with diode structures for mixed-power supply systems. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (IEEE J. Solid State Circuits, 2004)