Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity. - Jun Hee Han; Yoonseob Jeong; Minkyu Chun; Sang Won Yoon; Jeong-Hyeon Choi; Young Jun Choi; Young Mi Kim; Sang-Hoon Jung; Joon-Young Yang; Sooyoung Yoon (J. Intell. Manuf., 2025)