Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor. - Moonyoung Jeong; Sangho Lee; Yootak Jun; Kiseok Lee; Seokhan Park; Jeonghoon Oh; Ilgweon Kim; Jemin Park (IRPS, 2024)

A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor. - Moonyoung Jeong; Hyungjun Noh; Sangho Lee; Yootak Jun; Jeonghoon Oh; Jemin Park; Jaihyuk Song (IRPS, 2025)