Electronic circuit reliability modeling. - Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li 001; Jörg Walters; Yoram Shapira; Michael Talmor (Microelectron. Reliab., 2006)

Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors. - Ronen A. Berechman; Boris Revzin; Yoram Shapira (Microelectron. Reliab., 2007)