A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm. - Yoseop Lim; Jaeseok Park; Sungho Kang 001 (IEICE Electron. Express, 2012)

An accurate diagnosis of transition fault clusters based on single fault simulation. - Yoseop Lim; Jaeseok Park; Sungho Kang 001 (IEICE Electron. Express, 2012)