Enhancing Transition Fault Model for Delay Defect Diagnosis. - Wu-Tung Cheng; Brady Benware; Ruifeng Guo; Kun-Han Tsai; Takeo Kobayashi; Kazuyuki Maruo; Michinobu Nakao; Yoshiaki Fukui; Hideyuki Otake (ATS, 2008)

A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule. - Masanori Kurimoto; Jun Matsushima; Shigeki Ohbayashi; Yoshiaki Fukui (ISQED, 2010)

Low Power Decompressor and PRPG with Constant Value Broadcast. - Michal Filipek; Yoshiaki Fukui; Hiroyuki Iwata; Grzegorz Mrugalski; Janusz Rajski; Masahiro Takakura; Jerzy Tyszer (Asian Test Symposium, 2011)

A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule. - Masanori Kurimoto; Jun Matsushima; Shigeki Ohbayashi; Yoshiaki Fukui; Michio Komoda; Nobuhiro Tsuda (ACM Trans. Design Autom. Electr. Syst., 2012)