Process modeling and simulation: boundary conditions for point defect-based impurity diffusion model. - Kenji Taniguchi 001; Yoshiaki Shibata; Chihiro Hamaguchi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

A fast degradation-free algorithm for DCT block extraction in the compressed domain. - Yoshiaki Shibata; Zhigang Chen 005; Roy H. Campbell (ICASSP, 1999)