Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. - Michele Riccio; Lucio Rossi; Andrea Irace; Ettore Napoli; Giovanni Breglio; Paolo Spirito; Ryuzo Tagami; Yoshihito Mizuno (Microelectron. Reliab., 2010)

Analysis of current distribution on IGBT under unclamped inductive switching conditions. - Yohei Iwahashi; Yoshihito Mizuno; Masafumi Hara; Ryuzo Tagami; Masanori Ishigaki (Microelectron. Reliab., 2012)