Test Pattern Considerations for Fault Tolerant High Density DRAM. - Hiroshi Miyamoto; Koichiro Mashiko; Yoshikazu Morooka; Kazutami Arimoto; Michihiro Yamada; Takao Nakano (ITC, 1985)

An Address Maskable Parallel Testing for Ultra High Density DRAMs. - Yoshikazu Morooka; Shigeru Mori; Hiroshi Miyamoto; Michihiro Yamada (ITC, 1991)

A 45-ns 64-Mb DRAM with a merged match-line test architecture. - Shigeru Mori; Hiroshi Miyamoto; Yoshikazu Morooka; Shigeru Kikuda; Makoto Suwa; Mitsuya Kinoshita; Atsushi Hachisuka; Hideaki Arima; Michihiro Yamada; Tsutomu Yoshihara; Shimpei Kayano (IEEE J. Solid State Circuits, 1991)

An adjustable output driver with a self-recovering Vpp generator for a 4M⨉16 DRAM. - Kiyohiro Furutani; Hiroshi Miyamoto; Yoshikazu Morooka; Makoto Suwa; Hideyuki Ozaki (IEEE J. Solid State Circuits, 1994)

An efficient back-bias generator with hybrid pumping circuit for 1.5-V DRAMs. - Yasuhiko Tsukikawa; Takeshi Kajimoto; Yasuhiko Okasaka; Yoshikazu Morooka; Kiyohiro Furutani; Hiroshi Miyamoto; Hideyuki Ozaki (IEEE J. Solid State Circuits, 1994)

A low power and high speed data transfer scheme with asynchronous compressed pulse width modulation for AS-Memory. - Tadaaki Yamauchi; Yoshikazu Morooka; Hideyuki Ozaki (IEEE J. Solid State Circuits, 1996)

Source-synchronization and timing vernier techniques for 1.2-GB/s SLDRAM interface. - Yasunobu Nakase; Yoshikazu Morooka; David J. Perlman; Daniel J. Kolor; Jae-Myoung Choi; Hyun J. Shin; Tsutomu Yoshimura; Naoya Watanabe; Yoshio Matsuda; Masaki Kumanoya; Michihiro Yamada (IEEE J. Solid State Circuits, 1999)

A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. - Masaru Haraguchi; Tokuya Osawa; Akira Yamazaki; Chikayoshi Morishima; Toshinori Morihara; Yoshikazu Morooka; Yoshihiro Okuno; Kazutami Arimoto (ISSCC, 2007)

A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. - Masaru Haraguchi; Tokuya Osawa; Akira Yamazaki; Chikayoshi Morishima; Toshinori Morihara; Yoshikazu Morooka; Yoshihiro Okuno; Kazutami Arimoto (IEICE Trans. Electron., 2009)