An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation. - Hidetoshi Matsuoka; Hiroshi Ikeda; Hiroyuki Higuchi; Yoshinori Tomita (ISQED, 2010)

Sequence-based In-Circuit Breakpoints for Post-Silicon Debug (Abstract Only). - Yutaka Tamiya; Yoshinori Tomita; Toshiyuki Ichiba; Kaoru Kawamura (FPGA, 2015)

Data-triggered breakpoint for in-circuit debug without re-implementation. - Yutaka Tamiya; Yoshinori Tomita; Toshiyuki Ichiba; Kaoru Kawamura (FPL, 2015)

Mapping Constrained Slot-Placement Problems to Ising Models and its Evaluations by an Ising Machine. - Sho Kanamaru; Kazushi Kawamura; Shu Tanaka; Yoshinori Tomita; Hidetoshi Matsuoka; Kaoru Kawamura; Nozomu Togawa (ICCE-Berlin, 2019)

A Three-Stage Annealing Method Solving Slot-Placement Problems Using an Ising Machine. - Keisuke Fukada; Matthieu Parizy; Yoshinori Tomita; Nozomu Togawa (IEEE Access, 2021)

Solving Constrained Slot Placement Problems Using an Ising Machine and Its Evaluations. - Sho Kanamaru; Kazushi Kawamura; Shu Tanaka; Yoshinori Tomita; Nozomu Togawa (IEICE Trans. Inf. Syst., 2021)

Large-Sized VQE Performance Profiling in Quantum Chemistry Using a Multi-Node Quantum Simulator. - Keisuke Fukada; Tatsuhiko Shirai; Mikio Morita; Yoshinori Tomita; Koichi Kimura; Nozomu Togawa (QCE, 2024)

Simulator Demonstration of Large Scale Variational Quantum Algorithm on HPC Cluster. - Mikio Morita; Yoshinori Tomita; Junpei Koyama; Koichi Kimura (IEEE Access, 2024)