Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing. - Mutsuo Daito; Yoshiro Nakata; Satoshi Sasaki; Hiroyuki Gomyo; Hideki Kusamitsu; Yoshio Komoto; Kunihiko Iizuka; Katsuyuki Ikeuchi; Gil-Su Kim; Makoto Takamiya; Takayasu Sakurai (IEEE J. Solid State Circuits, 2011)