A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System. - Yasutoshi Otani; Eiji Ishiwa; Nobuo Arai; Yoshio Yamanaka (ITC, 1982)

A New Approach to DC Parameter Measurement in the Day of VLSI. - Takeshi Shigematsu; Takashi Sakamoto; Yoshio Yamanaka (ITC, 1983)

Parallel Testing of Random Logic LSIs. - Nobuo Arai; Yoshio Yamanaka (ITC, 1984)