Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. - You-Lin Wu; Shi-Tin Lin; Tsung-Min Chang; Juin J. Liou (Microelectron. Reliab., 2007)

Electrical Characterization of Sequence-specific Label-free DNA by using Polysilicon Wire. - You-Lin Wu; Po-Yen Hsu; Chung-Ping Hsu; Wen-Cheng Liu (BIODEVICES, 2010)

Characteristics of Polysilicon Wire Glucose Sensors with a Surface Modified by Silica Nanoparticles/γ-APTES Nanocomposite. - Jing-Jenn Lin; Po-Yen Hsu; You-Lin Wu; Jheng-Jia Jhuang (Sensors, 2011)

Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy. - Shih-Hung Lin; You-Lin Wu; Yu-Huei Hwang; Jing-Jenn Lin (Microelectron. Reliab., 2015)

Fall Detection in Stairwells Based on Depth Images and Deep Learning. - Jia-Hong Lee; You-Lin Wu; Mei-Yi Wu (ICCCM, 2024)