BSIM4-based lateral diode model for LNA co-designed with ESD protection circuit. - Ming-Ta Yang; Yang Du; Charles Teng; Tony Chang; Eugene Worley; Ken Liao; You-Wen Yau; Geoffrey Yeap (ISQED, 2010)

The electromigration behavior of copper pillars for different current directions and pillar shapes. - Christine S. Hau-Riege; You-Wen Yau; Kevin Caffey; Rajneesh Kumar; YangYang Sun; Andy Bao; Milind Shah; Lily Zhao; Omar Bchir; Ahmer Syed; Steve Bezuk (IRPS, 2015)

Electromigration of multi-solder ball test structures. - Christine S. Hau-Riege; Huilin Xu; You-Wen Yau; Manasi S. Kakade; Jianfeng Li; Xiaonan Zhang; Hosain Farr (IRPS, 2018)