A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. - Youbean Kim; Myung-Hoon Yang; Yong Lee 002; Sungho Kang 001 (Asian Test Symposium, 2005)

TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. - Youbean Kim; Dongsup Song; Kicheol Kim; Incheol Kim; Sungho Kang (ATS, 2006)

A New Analog-to-Digital Converter BIST Considering a Transient Zone. - Incheol Kim; Kicheol Kim; Youbean Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2007)

Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. - Myung-Hoon Yang; Youbean Kim; Youngkyu Park; D. Lee; Sungho Kang 001 (IET Comput. Digit. Tech., 2007)

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. - Youbean Kim; Kicheol Kim; Incheol Kim; Sungho Kang (IEICE Trans. Electron., 2008)

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. - Kicheol Kim; Youbean Kim; Incheol Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2008)

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. - Youbean Kim; Kicheol Kim; Incheol Kim; Hyunwook Son; Sungho Kang (IEICE Trans. Inf. Syst., 2008)

Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. - Youbean Kim; Jaewon Jang; Hyunwook Son; Sungho Kang (IEICE Trans. Inf. Syst., 2010)

Low Loss Hybrid-Plane PCB Structure for Improving Signal Quality in High-Speed Signal Transmission. - Jeonghyeon Choi; Youbean Kim (IEEE Access, 2024)

Technologies and Solutions for Cattle Tracking: A Review of the State of the Art. - Saúl Montalván; Pablo Arcos; Pablo Sarzosa; Richard Alejandro Rocha; Sang Guun Yoo; Youbean Kim (Sensors, 2024)