Automatic line-shaped defect evaluation of solid-state imaging device. - Toshio Asano; Seiji Hata; Susumu Koishikawa; Youichi Shimizu (Syst. Comput. Jpn., 1990)

Improvement of Sensing Performance of Impedancemetric C2H2 Sensor Using SmFeO3 Thin-Films Prepared by a Polymer Precursor Method. - Tomohisa Tasaki; Satoko Takase; Youichi Shimizu (Sensors, 2019)