The study of TSV-induced and strained silicon-enhanced stress in 3D-ICs. - Jindong Zhou; Yuyang Chen; Youliang Jing; Pingqiang Zhou (Integr., 2023)

Machine Learning-Based Device Modeling and Performance Optimization for FinFETs. - Huifan Zhang; Youliang Jing; Pingqiang Zhou (IEEE Trans. Circuits Syst. II Express Briefs, 2023)