An oversampling method for wafer map defect pattern classification considering small and imbalanced data. - Eun-Su Kim; Seung-Hyun Choi; Dong-Hee Lee; Kwang-Jae Kim; Young-Mok Bae; Young-Chan Oh (Comput. Ind. Eng., 2021)

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods. - Dong-Hee Lee; Eun-Su Kim; Seung-Hyun Choi; Young-Mok Bae; Jong-Bum Park; Young-Chan Oh; Kwang-Jae Kim (Comput. Ind., 2023)

Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map. - Seung-Hyun Choi; Dong-Hee Lee; Eun-Su Kim; Young-Mok Bae; Young-Chan Oh; Kwang-Jae Kim (Adv. Eng. Informatics, 2024)