PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition. - Jung Hwan Lee; Young-Don Ko; Min-Chang Jeong; Jae-Min Myoung; Ilgu Yun (ISNN (2), 2006)

Modeling growth rate of HfO2 thin films grown by metal-organic molecular beam epitaxy. - Myoung-Seok Kim; Young-Don Ko; Tae-Houng Moon; Jae-Min Myoung; Ilgu Yun (Microelectron. J., 2006)

Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics. - Young-Don Ko; Moon-Ho Ham; Jae-Min Myoung; Ilgu Yun (Artificial Intelligence and Applications, 2007)

Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling. - Kyoung Eun Kweon; Jung Hwan Lee; Young-Don Ko; Min-Chang Jeong; Jae-Min Myoung; Ilgu Yun (Expert Syst. Appl., 2007)

Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates. - Jung Hwan Lee; Dong-Hun Kang; Young-Don Ko; Jaejin Jang; Dae-Shik Seo; Ilgu Yun (Expert Syst. Appl., 2008)

Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms. - Young-Don Ko; Pyung Moon; Chang Eun Kim; Moon-Ho Ham; Jae-Min Myoung; Ilgu Yun (Expert Syst. Appl., 2009)

Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing. - Young-Seon Jeong 001; Byungwhan Kim; Young-Don Ko (Expert Syst. Appl., 2013)

A Modeling Toolbox and Its Applications to Statistical Process Modeling. - Young-Don Ko; Helen Shang (J. Softw., 2013)