Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model. - Young-Gu Kim; Sang-Hoon Lee; Dae-Han Kim; Jae-Woo Im; Sung-Eun Yu; Dae-Wook Kim; Young-Kwan Park; Jeong-Taek Kong (ISQED, 2006)

The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. - Young-Gu Kim; Soo-Hwan Kim; Hoon Lim; Sanghoon Lee; Keun-Ho Lee; Young-Kwan Park; Moon-Hyun Yoo (ISQED, 2008)

Generative Evolutionary Strategy For Black-Box Optimizations. - Changhwi Park; Seong Ryeol Kim; Young-Gu Kim; Dae Sin Kim (CoRR, 2022)

Solving the dopant diffusion dynamics with physics-informed neural networks. - Sungyeop Lee; Jisu Ryu; Young-Gu Kim; Dae Sin Kim; Hiroo Koshimoto; Jaeshin Park (J. Comput. Sci., 2025)