Intelligent integrated plant operation system for Six Sigma. - Chonghun Han; Young-Hak Lee (Annu. Rev. Control., 2002)

Data based segmentation and summarization for sensor data in semiconductor manufacturing. - Eunjeong L. Park; Jooseoung Park; Jiwon Yang; Sungzoon Cho; Young-Hak Lee; Hae-Sang Park (Expert Syst. Appl., 2014)

Ranking process parameter association with low yield wafers using spec-out event network analysis. - Jiwon Yang; Seung-kyung Lee; Seokho Kang 001; Sungzoon Cho; Young-Hak Lee; Hae-Sang Park (Comput. Ind. Eng., 2017)