Yiel Learning via Functional Test Data. - Young-Jun Kwon; D. M. H. Walker (ITC, 1995)

FakeFault: a silicon debug software tool for microprocessor embedded memory arrays. - Young-Jun Kwon; Ben Mathew; Hong Hao (ITC, 1998)

A Systematic Generation of Initial Register-Reuse Chains for Dependence Minimization. - Yukong Zhang; Young-Jun Kwon; Hyuk-Jae Lee (ACM SIGPLAN Notices, 2001)