Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. - Kwan-Do Kim; Young-Kwan Park; Jun-Ha Lee; Jeong-Taek Kong; Hee-Sung Kang; Young-Wug Kim; Seok-Jin Kim (ISQED, 2000)

Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. - Tae-Jin Kwon; Sang-Hoon Lee; Tae-Seon Kim; Hoe-Jin Lee; Young-Kwan Park; Taek-Soo Kim; Seok-Jin Kim; Jeong-Taek Kong (ISQED, 2001)

Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. - Jin-Kyu Park; Keun-Ho Lee; Chang-Sub Lee; Gi-Young Yang; Young-Kwan Park; Jeong-Taek Kong (ISQED, 2002)

Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. - Won-Seok Lee; Keun-Ho Lee; Jin-Kyu Park; Tae-Kyung Kim; Young-Kwan Park; Jeong-Taek Kong (ISQED, 2003)

Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model. - Young-Gu Kim; Sang-Hoon Lee; Dae-Han Kim; Jae-Woo Im; Sung-Eun Yu; Dae-Wook Kim; Young-Kwan Park; Jeong-Taek Kong (ISQED, 2006)

The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. - Young-Gu Kim; Soo-Hwan Kim; Hoon Lim; Sanghoon Lee; Keun-Ho Lee; Young-Kwan Park; Moon-Hyun Yoo (ISQED, 2008)