Gate-Oxide Early Life Failure Prediction. - Tze Wee Chen; Kyunglok Kim; Young Moon Kim; Subhasish Mitra (VTS, 2008)

Overcoming Early-Life Failure and Aging for Robust Systems. - Yanjing Li; Young Moon Kim; Evelyn Mintarno; Donald S. Gardner; Subhasish Mitra (IEEE Des. Test Comput., 2009)

Cross-layer error resilience for robust systems. - Larkhoon Leem; Hyungmin Cho; Hsiao-Heng Lee; Young Moon Kim; Yanjing Li; Subhasish Mitra (ICCAD, 2010)

Gate-oxide early-life failure identification using delay shifts. - Young Moon Kim; Tze Wee Chen; Yoshio Kameda; Masayuki Mizuno; Subhasish Mitra (VTS, 2010)

Robust System Design to Overcome CMOS Reliability Challenges. - Subhasish Mitra; Kevin Brelsford; Young Moon Kim; Hsiao-Heng Lee; Yanjing Li (IEEE J. Emerg. Sel. Topics Circuits Syst., 2011)

Robust System Design. - Subhasish Mitra; Hyungmin Cho; Ted Hong; Young Moon Kim; Hsiao-Heng Lee; Larkhoon Leem; Yanjing Li; David Lin; Evelyn Mintarno; Diana Mui; Sung-Boem Park; Nishant Patil; et al. (IPSJ Trans. Syst. LSI Des. Methodol., 2011)

Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. - Young Moon Kim; Jun Seomun; Hyung-Ock Kim; Kyung Tae Do; Jung Yun Choi; Kee Sup Kim; Matthias Sauer 002; Bernd Becker 001; Subhasish Mitra (CICC, 2013)

Early-life-failure detection using SAT-based ATPG. - Matthias Sauer 002; Young Moon Kim; Jun Seomun; Hyung-Ock Kim; Kyung Tae Do; Jung Yun Choi; Kee Sup Kim; Subhasish Mitra; Bernd Becker 001 (ITC, 2013)

The resilience wall: Cross-layer solution strategies. - Subhasish Mitra; Pradip Bose; Eric Cheng; Chen-Yong Cher; Hyungmin Cho; Rajiv V. Joshi; Young Moon Kim; Charles R. Lefurgy; Yanjing Li; Kenneth P. Rodbell; Kevin Skadron; James H. Stathis; et al. (VLSI-DAT, 2014)

System-Level Power Analysis of a Multicore Multipower Domain Processor With ON-Chip Voltage Regulators. - Ayan Paul; Sang Phill Park; Dinesh Somasekhar; Young Moon Kim; Nitin Borkar; Ulya R. Karpuzcu; Chris H. Kim (IEEE Trans. Very Large Scale Integr. Syst., 2016)