7.2 A 128Gb 3b/cell V-NAND flash memory with 1Gb/s I/O rate. - Jae-Woo Im; Woopyo Jeong; Doo-Hyun Kim; Sangwan Nam; Dong-Kyo Shim; Myung-Hoon Choi; Hyun-Jun Yoon; Dae-Han Kim; Youse Kim; Hyun Wook Park; Dong-Hun Kwak; Sang-Won Park; et al. (ISSCC, 2015)

WL under-driving scheme with decremental step voltage and incremental step time for high-capacity NAND flash memory. - Junyoung Ko; Younghwi Yang; Seong-Ook Jung; Jisu Kim; Cheon An Lee; Young-Sun Min; Jin-Young Chun; Moosung Kim (ISCAS, 2016)

7.1 256Gb 3b/cell V-NAND flash memory with 48 stacked WL layers. - Dongku Kang; Woopyo Jeong; Chulbum Kim; Doo-Hyun Kim; Yong-Sung Cho; Kyung-Tae Kang; Jinho Ryu; Kyung-Min Kang; Sungyeon Lee; Wandong Kim; Hanjun Lee; Jaedoeg Yu; et al. (ISSCC, 2016)

11.4 A 512Gb 3b/cell 64-stacked WL 3D V-NAND flash memory. - Chulbum Kim; Ji-Ho Cho; Woopyo Jeong; Il-Han Park; Hyun Wook Park; Doo-Hyun Kim; Daewoon Kang; Sunghoon Lee; Ji-Sang Lee; Wontae Kim 004; Jiyoon Park; Yang-Lo Ahn; et al. (ISSCC, 2017)

256 Gb 3 b/Cell V-nand Flash Memory With 48 Stacked WL Layers. - Dongku Kang; Woopyo Jeong; Chulbum Kim; Doo-Hyun Kim; Yong-Sung Cho; Kyung-Tae Kang; Jinho Ryu; Kyung-Min Kang; Sungyeon Lee; Wandong Kim; Hanjun Lee; Jaedoeg Yu; et al. (IEEE J. Solid State Circuits, 2017)

A 1Tb 4b/cell 64-stacked-WL 3D NAND flash memory with 12MB/s program throughput. - Seungjae Lee 001; Chulbum Kim; Minsu Kim 004; Sung-Min Joe; Joonsuc Jang; Seungbum Kim; Kangbin Lee; Jisu Kim; Jiyoon Park; Hanjun Lee; Min-Seok Kim; Seonyong Lee; et al. (ISSCC, 2018)

A 512Gb 3-bit/Cell 3D 6th-Generation V-NAND Flash Memory with 82MB/s Write Throughput and 1.2Gb/s Interface. - Dongku Kang; Minsu Kim 004; Suchang Jeon; Wontaeck Jung; Jooyong Park; Gyo Soo Choo; Dong-Kyo Shim; Anil Kavala; Seungbum Kim; Kyung-Min Kang; Jiyoung Lee; Kuihan Ko; et al. (ISSCC, 2019)

Variation-Tolerant WL Driving Scheme for High-Capacity NAND Flash Memory. - Junyoung Ko; Younghwi Yang; Jisu Kim; Cheon An Lee; Young-Sun Min; Jin-Young Chun; Moosung Kim; Seong-Ook Jung (IEEE Trans. Very Large Scale Integr. Syst., 2019)