Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. - Jongkyun Kim; Namhyun Lee; Gang-Jun Kim; Young-Yun Lee; Jung-Eun Seok; Yunsung Lee (Microelectron. Reliab., 2018)

Estimation of Remaining Useful Life from the Aging Degradation in IC Performance Parameters. - Jiho Lee; Jiwon Kim; Seyoung Kim; Young-Yun Lee; Kanghyun Seo; Jung Yun Choi (IRPS, 2025)