Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. - Hochul Lee; Youngchang Yoon; Seongjae Cho; Hyungcheol Shin (IEICE Trans. Electron., 2007)

FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. - Hochul Lee; Youngchang Yoon; Ickhyun Song; Hyungcheol Shin (IEICE Trans. Electron., 2008)

Highly Linear RF CMOS Variable Attenuators With Adaptive Body Biasing. - Yan-Yu Huang; Wangmyong Woo; Youngchang Yoon; Chang-Ho Lee (IEEE J. Solid State Circuits, 2011)

A Linear Multi-Mode CMOS Power Amplifier With Discrete Resizing and Concurrent Power Combining Structure. - Jihwan Kim; Youngchang Yoon; Hyungwook Kim; Kyu Hwan An; Woonyun Kim; Hyun-Woong Kim; Chang-Ho Lee; Kevin T. Kornegay (IEEE J. Solid State Circuits, 2011)

A Fully-Integrated High-Power Linear CMOS Power Amplifier With a Parallel-Series Combining Transformer. - Jihwan Kim; Woonyun Kim; Hamhee Jeon; Yan-Yu Huang; Youngchang Yoon; Hyungwook Kim; Chang-Ho Lee; Kevin T. Kornegay (IEEE J. Solid State Circuits, 2012)

A 2.4-GHz CMOS Power Amplifier With an Integrated Antenna Impedance Mismatch Correction System. - Youngchang Yoon; Hyoungsoo Kim; Hyungwook Kim; Kun-Seok Lee; Chang-Ho Lee; James S. Kenney (IEEE J. Solid State Circuits, 2014)

A 5.5-GHz CMOS power amplifier using parallel-combined transistors with cascode adaptive biasing for WLAN applications. - Seungjun Baek; Hyunjin Ahn; Ilku Nam; Joonhoi Hur; Youngchang Yoon; Ockgoo Lee (IEICE Electron. Express, 2018)