Investigation of capture and emission dependence between individual traps from complex random telegraph signal noise analysis. - Younghwan Son; Yoon Kim; Myounggon Kang (IEICE Electron. Express, 2017)

Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide. - Younghwan Son; Yoon Kim; Myounggon Kang (IEICE Electron. Express, 2017)

Innovative V-NAND Flash Structure with Dual Trap Layer for Future Generations of Multi-Bit Device. - Jeongyoon Yeo; Joonsung Kim; Younghwan Son; Taein Lee; Sejun Park; Min-Kyu Jeong; Jung Hoon Lee; Suk-Kang Sung; Dongku Kang; Seungwan Hong; Sunghoi Hur (IMW, 2025)