Area Efficient Built-In Redundancy Analysis using Pre-Solutions with Various Spare Structure. - Youngki Moon; Hyunho Yoo; Donghyun Han; Sungho Kang 001 (ISOCC, 2021)

Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis. - Sunghoon Kim; Seokjun Jang; Youngki Moon; Sungho Kang 001 (ISOCC, 2022)

Effective Data-Width Aware ECC Scheme for HBM. - Seung Ho Shin; Youngki Moon; Byungsoo Kim; Sungho Kang 001 (ISOCC, 2024)

PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks. - Seokjun Jang; Youngki Moon; Duyeon Won; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)

A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM. - Youngki Moon; Seung Ho Shin; Seokjun Jang; Duyeon Won; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2025)

A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM. - Joonsik Yoon; Hayoung Lee; Youngki Moon; Seung Ho Shin; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)