Temperature-dependent resistive switching characteristics for Au/n-type CuAlOx/heavily doped p-type Si devices. - Yow-Jon Lin; Yu-Ju Chu (Microelectron. Reliab., 2016)

Electrical conduction mechanisms in the temperature-dependent current-voltage characteristics of poly(3-hexylthiophene)/n-type Si devices. - Hong-Zhi Lin; Yow-Jon Lin (Microelectron. Reliab., 2016)

Temperature dependence of current-voltage characteristics of MoS2/Si devices prepared by the chemical vapor deposition method. - Ting-Hong Su; Chia-Hung Chiang; Yow-Jon Lin (Microelectron. Reliab., 2017)

Temperature-dependent hole transport for pentacene thin-film transistors with a SiO2 gate dielectric modified by (NH4)2Sx treatment. - Yow-Jon Lin; Cheng-Chun Hung (Microelectron. Reliab., 2018)