Numerical Simulations of Gate-Granularity- Induced Subthreshold Characteristics Deterioration of MOSFETs Magnified at Cryogenic Temperatures. - Kuo-Hsing Kao; Zong-Hong Wang; Yu-Chia Pai; Chen-Chi Cheng; Darsen D. Lu; Wen-Jay Lee; Nan-Yow Chen (IEEE Access, 2024)