A New Image Registration Method Using Intensity Difference Data on Overlapped Image. - Shu-Kai S. Fan; Yu-Chiang Chuang (UIC/ATC Workshops, 2010)

Automatic detection of Mura defect in TFT-LCD based on regression diagnostics. - Shu-Kai S. Fan; Yu-Chiang Chuang (Pattern Recognit. Lett., 2010)

An entropy-based image registration method using image intensity difference on overlapped region. - Shu-Kai S. Fan; Yu-Chiang Chuang (Mach. Vis. Appl., 2012)

An Entropy-based Method for Color Image Registration. - Shu-Kai S. Fan; Yu-Chiang Chuang (VISAPP (1), 2013)