Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications. - Sascha Hermann; Holger Fiedler; Yu Haibo; Sergei Loschek; Jens Bonitz; Stefan E. Schulz; Thomas Gessner (SSD, 2012)

Reliability Evaluation of Smart Meters Under Degradation-Shock Loads Based on Phase-Type Distributions. - Dan Xu 004; Xiaoqi Xiao; Yu Haibo (IEEE Access, 2020)

LLM-Based Structuring of Oral Discussion in Workshop to Support Collaboration Among Local Government and Simulated Citizens. - Gen Sato; Shun Shiramatsu; Mizuki Hoshino; Shuhei Watanabe; Yu Haibo; Takeshi Mizumoto (CollabTech, 2024)