A novel method to improve cell endurance window in source-side injection split gate flash memory. - Yong-Shiuan Tsair; Yean-Kuen Fang; Feng-Renn Juang; Yu-Hsiung Wang; Wen-Ting Chu; Yung-Tao Lin; Luan Tran (Microelectron. Reliab., 2012)