Low Power BIST with Smoother and Scan-Chain Reorder . - Nan-Cheng Lai; Sying-Jyan Wang; Yu-Hsuan Fu (Asian Test Symposium, 2004)

Test Data Compression with Partial LFSR-Reseeding. - Yu-Hsuan Fu; Sying-Jyan Wang (Asian Test Symposium, 2005)