Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits. - Erik Jan Marinissen; Ferenc Fodor; Arnita Podpod; Michele Stucchi; Yu-Rong Jian; Cheng-Wen Wu (ITC, 2018)

Automated Probe-Mark Analysis for Advanced Probe Technology Characterization. - Yu-Rong Jian; Ferenc Fodor; Cheng-Wen Wu; Erik Jan Marinissen (IEEE Des. Test, 2021)